Package Springer Book Archive - Springer Engineering 1990-1999

Provider
Springer Nature
Status
Current
Description
URL
UUID
e10cb5d9-05aa-4b92-9627-39e083c0fd4e

Curated By

  • TU Chemnitz

TIPPs (1775)

Name Identifiers Coverage
Testability Concepts for Digital ICs
  • isbn : 9781461523659
  • pisbn : 9780792396581
 Fulltext
Introduction to IDDQ Testing
  • isbn : 9781461561378
  • pisbn : 9780792399452
 Fulltext
From Contamination to Defects, Faults and Yield Loss
  • isbn : 9781461313779
  • pisbn : 9780792397144
 Fulltext
Multi-Chip Module Test Strategies
  • isbn : 9781461561071
  • pisbn : 9780792399209
 Fulltext
Delay Fault Testing for VLSI Circuits
  • isbn : 9781461555971
  • pisbn : 9780792382959
 Fulltext
Analog and Mixed-Signal Boundary-Scan
  • isbn : 9781475744996
  • pisbn : 9780792386865
 Fulltext
Reasoning in Boolean Networks
  • isbn : 9781475725728
  • pisbn : 9780792399216
 Fulltext
Defect Oriented Testing for CMOS Analog and Digital Circuits
  • isbn : 9781475749267
  • pisbn : 9780792380832
 Fulltext
Efficient Branch and Bound Search with Application to Computer-Aided Design
  • isbn : 9781461313298
  • pisbn : 9780792396734
 Fulltext
On-Line Testing for VLSI
  • isbn : 9781475760699
  • pisbn : 9780792381327
 Fulltext