Package IEEE Xplore All Series

Provider

IEEE

Status

Current

Description

URL

UUID

10864700-82e6-4f3b-8f4d-10c15560bd32

Curated By

• TU Hamburg

TIPPs (6078)

Name	Identifiers	Coverage
Terahertz Electronics, International Conference on	ieee : 1000752	Fulltext
Test and Measurement (ICTM), International Conference on	eissn : 2157-5606 issn : 2157-5592 ieee : 1003106	Fulltext
Test Conference in Asia (ITC-Asia), International	eissn : 2768-069X ieee : 1822444	Fulltext
Test Conference, IEEE International	eissn : 2378-2250 issn : 1089-3539 ieee : 1000753	Fulltext
Test Symposium (ETS), IEEE European	eissn : 1558-1780 issn : 1530-1877 ieee : 1000755	Fulltext
Test Workshop, ATW, Annual Atlantic	ieee : 1002343	Fulltext
Test Workshop, LATW, Latin American	issn : 2373-0862 ieee : 1002680	Fulltext
Test, Asian Symposium (ATS)	eissn : 2377-5386 issn : 1081-7735 ieee : 1000754	Fulltext
Testability Assessment (IWoTA), International Workshop on	ieee : 1002185	Fulltext
Testbeds and Research Infrastructures for the Development of Networks and Communities (TRIDENTCOM), International Conference on	ieee : 1001561	Fulltext