Package IEEE Xplore All Series

Provider
IEEE
Status
Current
Description
URL
UUID
10864700-82e6-4f3b-8f4d-10c15560bd32

Curated By

  • TU Hamburg

TIPPs (6078)

Name Identifiers Coverage
Declarative Cyber-Physical Systems (DCPS), CPSWeek Workshop on
  • ieee : 1815444
 Fulltext
Deep and Representation Learning (IWDRL), International Workshop on
  • ieee : 1825624
 Fulltext
Deep Learning and Machine Learning in Emerging Applications (Deep-ML), International Conference on
  • ieee : 1833665
 Fulltext
Deep Learning for Testing and Testing for Deep Learning (DeepTest), IEEE/ACM Third International Workshop on
  • ieee : 1842285
 Fulltext
Deep Learning on Supercomputers (DLS), IEEE/ACM Workshop on
  • ieee : 1834824
 Fulltext
Defect and Fault Tolerance in VLSI Systems (DFT), IEEE International Symposium on
  • eissn : 2377-7966
  • issn : 1550-5774
  • ieee : 1000190
 Fulltext
Defect Based Testing, Proceedings. IEEE International Workshop on
  • ieee : 1002387
 Fulltext
Defence Technology (ACDT), Asian Conference on
  • eissn : 2644-3082
  • ieee : 1807405
 Fulltext
Defense Science Research Conference and Expo (DSR)
  • ieee : 1800496
 Fulltext
Delhi Section Conference (DELCON), IEEE
  • ieee : 1846244
 Fulltext