Package IEEE Xplore All Conference Proceedings

Provider

IEEE

Status

Current

Description

URL

UUID

07a35a7f-0efc-4e00-80ef-69f47f33e581

Curated By

• TU Hamburg

TIPPs (33617)

Name	Identifiers	Coverage
2008 IEEE International Symposium on Technology and Society	isbn : 978-1-5090-7448-8 ieee : 4558058	Fulltext
2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT)	isbn : 978-1-5090-7744-1 ieee : 4522566	Fulltext
2008 IEEE International Symposium on Wireless Communication Systems	isbn : 978-1-5090-8080-9 ieee : 4695855	Fulltext
2008 IEEE International Symposium on Workload Characterization	isbn : 978-1-5090-8350-3 ieee : 4629859	Fulltext
2008 IEEE International Technology Management Conference (ICE)	ieee : 7461987	Fulltext
2008 IEEE International Test Conference	isbn : 978-1-5090-7813-4 ieee : 4690905	Fulltext
2008 IEEE International Vacuum Electronics Conference	isbn : 978-1-5090-7373-3 ieee : 4547419	Fulltext
2008 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement	isbn : 978-1-5090-7651-2 ieee : 4584234	Fulltext
2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems	isbn : 978-1-5090-7779-3 ieee : 4638314	Fulltext
2008 IEEE International Workshop on Factory Communication Systems	isbn : 978-1-5090-7362-7 ieee : 4629548	Fulltext