Package IEEE Xplore All Conference Proceedings

Provider
IEEE
Status
Current
Description
URL
UUID
07a35a7f-0efc-4e00-80ef-69f47f33e581

Curated By

  • TU Hamburg

TIPPs (33617)

Name Identifiers Coverage
2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
  • isbn : 978-1-6654-3988-6
  • ieee : 9617229
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2021 IEEE International Symposium on Workload Characterization (IISWC)
  • isbn : 978-1-6654-4173-5
  • ieee : 9668193
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2021 IEEE International Systems Conference (SysCon)
  • isbn : 978-1-6654-4439-2
  • ieee : 9447020
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2021 IEEE International Test Conference (ITC)
  • isbn : 978-1-6654-1695-5
  • ieee : 9611037
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2021 IEEE International Test Conference in Asia (ITC-Asia)
  • isbn : 978-1-6654-1334-3
  • ieee : 9808359
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2021 IEEE International Test Conference India (ITC India)
  • isbn : 978-1-6654-3976-3
  • ieee : 9532482
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2021 IEEE International Ultrasonics Symposium (IUS)
  • isbn : 978-1-6654-0355-9
  • ieee : 9593294
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2021 IEEE International Women in Engineering (WIE) Conference on Electrical and Computer Engineering (WIECON-ECE)
  • isbn : 978-1-6654-7849-6
  • ieee : 9829529
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2021 IEEE International Workshop of Electronics, Control, Measurement, Signals and their application to Mechatronics (ECMSM)
  • isbn : 978-1-5386-1757-1
  • ieee : 9468818
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2021 IEEE International Workshop on Biometrics and Forensics (IWBF)
  • isbn : 978-1-7281-9556-8
  • ieee : 9464949
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