Package IEEE Xplore All Conference Proceedings

Provider
IEEE
Status
Current
Description
URL
UUID
07a35a7f-0efc-4e00-80ef-69f47f33e581

Curated By

  • TU Hamburg

TIPPs (33617)

Name Identifiers Coverage
2020 IEEE International Symposium on Systems Engineering (ISSE)
  • isbn : 978-1-7281-8602-3
  • ieee : 9272011
 Fulltext
2020 IEEE International Symposium on Technology and Society (ISTAS)
  • isbn : 978-1-6654-1507-1
  • ieee : 9462115
 Fulltext
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
  • isbn : 978-1-7281-6169-3
  • ieee : 9260488
 Fulltext
2020 IEEE International Symposium on Workload Characterization (IISWC)
  • isbn : 978-1-7281-7645-1
  • ieee : 9251098
 Fulltext
2020 IEEE International Systems Conference (SysCon)
  • isbn : 978-1-7281-5365-0
  • ieee : 9275655
 Fulltext
2020 IEEE International Test Conference (ITC)
  • isbn : 978-1-7281-9113-3
  • ieee : 9325188
 Fulltext
2020 IEEE International Test Conference in Asia (ITC-Asia)
  • isbn : 978-1-7281-8944-4
  • ieee : 9222394
 Fulltext
2020 IEEE International Test Conference India
  • isbn : 978-1-7281-7458-7
  • ieee : 9169748
 Fulltext
2020 IEEE International Ultrasonics Symposium (IUS)
  • isbn : 978-1-7281-5448-0
  • ieee : 9251288
 Fulltext
2020 IEEE International Women in Engineering (WIE) Conference on Electrical and Computer Engineering (WIECON-ECE)
  • isbn : 978-1-6654-1917-8
  • ieee : 9397876
 Fulltext